David Shuk Yin Tong is an academician of the CAS and TWAS, Fellow of the American Physics Society and an expert in surface science and technology. He graduated from the Faculty of Science, the University of Hong Kong in 1964, and received the M.S. and Ph.D. degrees in 1967 and 1969, respectively. Shuk Yin Tong has authored 6 books and published more than 280 journal articles, including 2 articles in Science, 2 articles in Physics Today, 1 article in Advances in Physics, 1 article in Progress in Surface Science, 1 article in Proceedings of National Academy of Sciences and 35 articles in Physical Review Letters. His total citation is over 10,000 and H factor 52.
◆ 2011-present, Leading professor, Southern University of Science and Technology;
◆ 2003-2009, Deputy President, City University of Hong Kong;
◆ 2002-2003, Vice President for Academic Affairs, City University of Hong Kong;
◆ 1994-2001, Head and Chair Professor, Department of Physics, University of Hong Kong;
◆ 1988-2000, Distinguished Professor, Department of Physics, the University of Wisconsin-Miwaukee.
◆ Recipient of the Shenzhen “Leading Talents”, 2011;
◆ Elected Academician of TWAS, 2010;
◆ Elected Academician of CAS, 2001;
◆ Recipient of the Croucher Foundation Research Fellowship, Hong Kong, 1997;
◆ 1991-1994, published six articles in international journals introducing the electron holography method into surface physics. This technology was granted a U.S. patent in 1992;
◆ Published the book “Surface Crystallography by Low-Energy Electron Diffraction” in 1979(co-author M A Van Hove), and it became a standard text in the field of surface structure. The book was cited over 600 times;
◆ Published a number of articles in international journals since 1971. These works successfully turned the electron scattering experiments of S Davission and L H Germer in1927 into a practical method for determining surface structure.
◆ W. F. Chung, Y. J. Feng, H. C. Poon, C. T. Chan, S. Y.Tong and M. S. Altman, "Layer Spacings in Coherently Strained Epitaxial Metal Films", Physical Review Letters, 90, 216105 (2003)
◆ D. D. D. Ma, C.S. Lee, F. C. K. Au, S.Y. Tong and S. T.Lee, "Small-Diameter Silicon Nanowire Surfaces", Science 299, 1874(2003)
◆ G. M. Gavaza, Z. X. Yu, L. Tsang, C. H. Chan, S. Y. Tong, M.A. Van Hove, “Efficient Calculation of Electron Diffraction for the Structural Determination of Nanomaterials”, Physical ReviewLetters,97,055505 (2006) Splitting Water on Metal Oxide Surfaces
◆ H. Xu, R. Q. Zhang, and S. Y. Tong, "Interaction of O(2), H(2)O, N(2), and O(3) with stoichiometric and reduced ZnO(10-10) surface", PHYSICAL REVIEWB, 82, 155326 (2010)
◆ H. Xu, R. Q. Zhang, A. M.C. Ng, A. B. Djurisic, H. T. Chan, W. K. Chan, and S. Y. Tong, "Splitting Water on Metal Oxide Surfaces", JOURNAL OF PHYSICAL CHEMISTRY C, 115, 19710 (2011)
◆ “Studies of Fundamental Properties of Nanosurfaces and Selected Applications”, Co-PI, The Hong Kong Research Grant Council ,7,400,000HKD;
◆ “Experimental and theoretical studies of tin oxide and copper oxide surfaces, their properties and passivation”, Co-PI, The Hong Kong Research Grant Council, 755,700HKD.
◆ “Low energy Electron and positron Diffraction”, NSFC Major Project, PI, 3.1 M RMB
◆ Tel: +86-755-88018208
◆ Add: Room 215, Research Building 2, Department of Physics, Southern University of Science and Technology, Nanshan District, Shenzhen, China